Delete comment from: Ken Shirriff's blog

Cole Johnson said...

Amazing how small the blown fuses are, no wonder they had reliability problems! Could you elaborate on footnote #6? It seems strange that the programming solution was so complicated when test points could've easily been added and probed during the check process.

It's also fairly apparent why MOS technology took over. One of the chips I simulated fit a ROM with 16x the capacity, the necessary decoding circuitry, a simple serial bus, a microcontroller, a digital filter, and a PWM engine all onto a single chip! And that was possible in 1980!

Aug 4, 2019, 12:00:32 AM

Posted to Looking inside a 1970s PROM chip that stores data in microscopic fuses